The target of the class is to provide to the students the cultural background to design the synthesis of functional organic nanostructures
The course aims to offer the student specific skills in the field of nanosciences with particular reference to the characterization of organic nanostructures.
The training is mainly aimed at the development of cognitive skills concerning the basic theoretical principles to be transferred to the technical / practical level, by means of appropriately designed laboratory experiences.
In particular, the achievement of the following skills is the primary training objective:
- ability to conceive and manage complex micro- and nano-systems
- correlation capacity between the nanometric characteristics of the organic structures and the functional properties deriving from them
- technical-scientific context and transversal capacities related to the characterization of nanostructured organic systems.
Lectures and exercises
The course is structured in two sections. The first part of classroom​ lectures and the second part of experimental laboratory activities
Organic nanostructures: bottom-up approach
Design of supramolecular structures. Self-assembly.The directional bonding and the weak-link approach.
Polymerization methodologies.Cross-coupling and metathesis reactions. Supramolecular polymers. Supramolecular capsules. Nanostructures for drug delivery.
Organic structures in molecular electronics: Oled and solar cells.
J.L. Atwood, J.W. Steed “Organic Nanostructures”, 2008 Wiley & VCH Verlag GmbH – Co. KGaA, Weinheim- ISBN: 978-3-527-31836-0.
P. Wyatt, S. Warren “Organic Synthesis-Strategy and Control” , 2007, John Wiley & Sons, Ltd.
S. Warren “Designing Organic Syntheses”, John Wiley &Sons
1. Educational material and lession's notes
2. Handbook of Nanoscopy. Gustaaf van Tendeloo, Dirk van Dyck, Stephen J. Pennycook, Wiley
3. Electrons in molecules: from basic principles to molecular electronics. Jean-Pierre Launay and
Michel Verdaguer, Oxford University Press
4. An Introduction to Surface Analysis by XPS and AES. John F. Watts, John Wolstenholme, Wiley
5. ToF-SIMS: Surface Analysis by Mass Spectrometry. John C. Vickerman and David Briggs,
IMPpubblications